Axiom Scientific Ltd
Axiom Scientific Ltd
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Axiom Scientific Ltd
Products Electron Microscopy

Electron Microscopy

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  • Integrated plasma cleaning and secure TEM holder storage in a single compact system

  • Effective hydrocarbon contamination removal to support high-resolution TEM imaging

  • Protects sensitive TEM holders and helps extend operational lifetime

  • Maintains holder cleanliness between experiments, reducing handling-related contamination

  • Stable, controlled plasma process for repeatable cleaning performance

  • User-friendly operation suitable for routine EM laboratory workflows

  • Improves imaging reliability and experimental reproducibility in TEM analysis

  • Ideal for university, research, and industrial electron microscopy facilities

  • Glow discharge for hydrophilic sample surface modification

    ·            Stable, uniform glow discharge for consistent surface treatment
    ·            Dedicated TEM grid sample stage for precise handling
    ·            Simultaneous cleaning of up to 12 copper grids, improving efficiency
    ·            Gentle gas inlet and exhaust to prevent sample displacement
    ·            Integrated safety interlock with automatic power cut-off when the chamber is opened

  • Magnetron sputter coating technology for rapid, uniform conductive thin-film deposition

  • Optimised for SEM sample preparation, reducing charging and improving image clarity

  • Multi-angle, height-adjustable sample stage for comprehensive coating coverage

  • Stable and repeatable deposition performance for routine and research workflows

  • Intuitive user interface with straightforward parameter control and monitoring

  • Compatible with a wide range of coating materials for diverse application needs

  • Low maintenance, laboratory-ready design ensuring reliable long-term operation

  • Suitable for materials science, life science, semiconductor, and industrial analysis

  • The Gas Injection System (GIS) is a fundamental component of FIB-SEM instrumentation, providing two key functions: material deposition and assisted etching.

    The Dalex-100 GIS supplies precursor gases including Pt, W, and C for protective deposition during cross-sectioning and TEM sample preparation, as well as Pt, W, and SiO₂ for circuit repair applications. It also enables XeF₂-assisted silicon etching to enhance cutting rates.

    In addition, the system supports a range of specialised precursor gases for targeted milling and gas-assisted dry etching of specific materials.


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